Gen5 PCIe U.3 Module
Part Number: QTL2662 / QTL2661
Product Details
Perform full hot-swap and physical layer fault injection with GEN5 U.3 drives, introducing our updated Gen5 PCIe U.3 Module.
Provides full hot-swap automation for GEN4 drives using the latest U.3 (SFF-TA-1001) specification. This module works with any U.3-compatible device, regardless of the protocol used – and offers support for Tri-mode drives.
The module has full control over power, data (dual port) and present pins, allowing simulation of any possible hot-swap scenario. Individual control of each signal, pin bounce and high-speed glitching combine to greatly increase the number of test cases you can perform. ‘Driving’ is available on some sideband pins. This allows a range of additional tests to drive signals high/low rather than just disconnecting them. The ‘+Triggering’ version has an additional MCX trigger IN/OUT to sync with external test equipment.
Use each module individually for simple bench testing. Use Multiple units to automate a storage enclosure as a whole.
Each Gen5 PCIe U.3 Module module requires one port on a Torridon Controller.
Features
- Automate full hot-swap of a GEN5 U.3 drive
- Simulate failures and intermittent faults
- Ideal for bench testing, debugging, and evaluation
- Scales from 1 to 100+ drive modules in a test system.
Features
- Automate full hot-swap of a GEN5 U.3 drive
- Simulate failures and intermittent faults
- Improve test coverage while decreasing duration
- Ideal for bench testing, debugging, and evaluation
- Scales from 1 to 100+ drive modules in a test system.
Technical
- Supports U.3 SFF drives up to 32GT/s
- Individual control over power, present, sideband and PCIe data signals
- 1us timing resolution on all switches
- 100ns pin-bounce resolution on all switches
- 50ns PRBS or user-sequenced glitch pulses on all lines
- Requires Torridon Array Controller or Interface Kit.
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