GEN6 EDSFF x4-4 Breaker

Product Details

This is the Gen6 EDSFF x4-4 Breaker (4 PCIe lanes, all switched).  It gives you the full range of features for the maximum level of testing. To see how it compares against the full range, check out the blog here.

The module has full control over power and sideband and PCIe data pins, allowing simulation of all hot-swap scenarios. Individual control of each signal, pin bounce, and high-speed glitching combine to greatly increase the number of test cases you can perform. ‘Driving’ is available on some sideband pins, allowing a range of additional tests to drive signals high/low rather than just disconnecting them.

Several versions are available: The ‘+Triggering’ version has an additional MCX trigger IN/OUT to sync with external test equipment. Versions are available to fit E1 and E3 enclosures.

It is possible to use individual drive modules for simple bench testing. For automated storage enclosures, multiple units can be used.

Each drive module requires one port on a Torridon Controller.

NOTE: We recommend evaluating this product in your test system before purchase

Contact your local reseller or email support@quarch.com