Gen6 MCIO x4 Breaker

Gen6 MCIO x4 Breaker

Part Number: QTL3209

Product Details

Gen6 MCIO breakers allow you to perform automated hot-swap and fault injection testing for MCIO cables. When you have a working MCIO link, and need to test lane restriction, hot-plug, and data fault injection then the Gen6 MCIO x4 Breaker is the ideal choice.

NOTE: Each module requires one port on a Torridon controller

The module has full control over power, data (x4 PCIe), and sideband pins, allowing simulation of any possible hot-swap scenario. Individual control of each signal, pin bounce, and high-speed glitching combine to greatly increase the number of test cases you can perform. ‘Driving’ is available on some sideband pins, allowing a range of additional tests to drive signals high/low rather than just disconnecting them. The ‘+Triggering’ version has an additional MCX trigger IN/OUT to sync with external test equipment.

The breaker module can be sold as various kits to ensure it fits various MCIO host enclosures as detailed in the technical manual’s mechanical characteristics section.

**NOTE:** We recommend evaluating this product in your test system before purchase

 

Features

  • Automate full hot-swap of any MCIO x4 device up to Gen6 speeds
  • Simulate failures, intermittent faults and more
  • Reduce lane width, inject data errors
  • Supports PCIe and CXL links

Technical

  • Supports PCIe devices up to Gen6 speeds
  • Individual control over power, sidebands, and PCIe data lanes
  • PCIe data lanes are all individually switched.  Both sides of the differential pairs can be individually controlled
  • Supports drives up to x4 lane width
  • Driving of signals: PRSNT, PERST, SMDAT, SMCLK, FLEXIO_0, FLEXIO_9
  • Monitoring of signals: PRSNT, SMCLK, SMDAT, PERST, FLEXIO_0, FLEXIO_9
  • 1us timing resolution on all switches
  • 100ns pin-bounce resolution on all switches
  • 50ns PRBS or user-sequenced glitch pulses
  • Requires Torridon Array Controller or Interface Kit.

Versions

QTL3209

Standard product, includes external triggering to sync with other test equipment and outside events or easy monitoring of sidebands into a scope or analyser.

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