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Hot-swap-White-Paper.pdf
This white paper covers the basics of hot-swap testing. Explaining the problems, technical concepts and then looking at methods of testing.
This if focussed at enterprise storage systems (SAS and NVMe SSDs and similar) but has a wide use case for any hot-swap component.
We cover both hot-swap timing and the effects pin bounce, both of which are critical to test for modern NVMe and newer CXL devices.
