AN-001 – Customizing Glitch & Drive Sequences

AN-001: Customizing Glitch & Drive Sequences

This application note provides guidance on customizing power and sideband sequencing using Quarch test automation tools. A customer had a specific timing sequence between PERST, REFCLK and 12V supply on a PCIe storage device that they needed to recreate. This example makes use of the ‘Breaker’ range of products from Quarch, which allows individual control of each active pin on the PCIe interface. The example code can be used as a base for many other similar test scenarios and on other physical interfaces. Setup instructions are given at the top of the python file. The overview for these products are described here: https://quarch.com/solutions/hot-swap-and-fault-injection/

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