The industry standard for hot-swap testing

Time-saving, money-saving, comprehensive

Time-saving, money-saving, comprehensive

Fully-repeatable, exceptionally accurate

Simulate any possible hot-swap scenario and create physical layer faults to expand your test coverage. Test dual redundant paths and fault-detection systems. Be ready to pass compliance tests of your latest products at the next NVMe Plugfest.


Be ready to test the newest technologies, such as SAS4 cables and Gen4 PCIe—stay ahead with Quarch’s Technical Updates.

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Advanced, repeatable testing of M.2 devices—discover Quarch’s range of products for hot-swap testing native M.2 products.

M.2 testing


Going to an NVMe Plugfest to get compliance test results for your products? Make sure you’re ready to pass!

NVMe Plugfest testing


Automate hot-swap testing and fault injection on USB cables for easier, faster and more detailed testing.

USB testing

Hot-swap & fault-injection at a glance

Interfaces supported

There are Quarch modules to support every major interface: PCIe, U.2, M.2, SAS, SATA, SFP, QSFP, LAN, SBB, OCulink, USB, and more. 

We also make custom modules—ideal for unusual interfaces. Email support@quarch.com or contact your local reseller.

Check the datasheets

Benefits

  • Repeatable testing & highly accurate timing.
  • Run a wider range of test scenarios. Fail a port, a lane, or even just one side of a differential pair.
  • Simulate intermittent or glitched faults with glitch times as low as 50nS.

Latest generation

Perform automated hot-swap on:

See the full range

 

Downloads

Related products

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