Hot-swapping and scenario testing is essential to ensure your drives retain their data in the event of a fault - but we don't think this needs to be as complicated as it has been.
Quarch Technology's flexible, modular system can be scaled to cover every requirement—from single-drive testing in early R&D, to 1000+ drives in a huge array. Incredibly fast and efficient, Our automation tools work seamlessly with your existing test systems to run thousands of device power cycles without manual intervention. Perform industry-standard tests repeatedly, with highly accurate timing, and simulate physical layer faults for comprehensive testing.
We proudly supply our fault-injection tools to silicon designers, system integrators, ODMs, and drive manufacturers across the globe. Quarch hot-swap modules are part of the mandatory testing schedule for NVMe SFF drives at the IOL Plugfests, implementing new types of testing to prove the reliability and robustness of NVMe.