Quarch at Plugfest #9

Quarch has been working with the University of New Hampshire’s InterOperability Laboratory (UNH-IOL) team for many years, helping them implement new types of testing to prove the reliability and robustness of NVMe devices.

We took our hot-plug testing station on the road this summer, attending Plugfest #9 in Durham, USA, and Wuhan, China. If you missed these events, here’s an introduction to what you need to know before the next Plugfest, so you can be confidant your device meets the specification.

NVMe Plugfest testing—the hot-plug challenge

Hot-plugging a PCIe device is a complex test scenario. Each U.2 drive tested at Plugfest must pass a series of different hot-plug tests, simulating everything from a very fast hot-plug (the drive being slammed quickly into the enclosure), to a slow plug. Five different speeds of hot-plug are tested, making for a total of 50 hot-plug events.

The device must correctly enumerate on the system every time, and the link speed and width must be the same every time. Potential failures include:

  • The drive does not enumerate
  • The drive connects at a lower speed
  • The drive connects at a lower lane width
  • The host PC crashes, shuts down or presents an error message.

How to repeat these tests in your lab

Get on top of your testing and be confidant your device meets the specification. Download our free application note, AN-003 - NVMe Plugfest testing, for:

  • Detailed descriptions of the mandatory tests
  • The latest scripts for running the Plugfest tests automatically in your lab
  • Recommendations for additional industry-standard testing you should carry out to ensure your device is compliant.

If you’re not currently part of the Plugfest, get in touch with the UNH team.

Stay ahead—get the latest information

The number of test scenarios required for a pass at future Plugfests is likely to increase year-on-year. For advance notice of changes to these hot-plug tests, sign up for the Quarch Technical Updates.

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